Finden Sie schnell schraubrohrschelle 50mm für Ihr Unternehmen: 4 Ergebnisse

Alphacen 300 Flex The Tip-Scanning AFM for Heavy and Large Samples

Alphacen 300 Flex The Tip-Scanning AFM for Heavy and Large Samples

The Alphacen 300 Flex system is a unique AFM solution that can handle large and heavy samples with ease. It features the Flex-Mount scan head, which has a tip-scanner design that enables high-performance imaging regardless of the sample size or weight. The CX controller, Nanosurf's most advanced AFM controller, offers fast and precise control over the scan process. The dedicated acoustic enclosure reduces external noise and vibrations. Moreover, the system can be further customized with additional translation or rotation axes to suit your specific sample. No other AFM system offers such versatility and functionality.
Ringbürste - normal

Ringbürste - normal

Besatz: Polyamid in verschiedenen Farben möglich, glatt oder gewellt Profilband: Stahl, elektrolytisch verzinkt oder Edelstahl AD = Aussendurchmesser: min. 18 mm möglich ID = Innendurchmesser: Nach Wunsch / Anforderung oder bündig
DriveAFM

DriveAFM

The DriveAFM is the ultimate tool for nanoscale research. It allows you to explore a variety of phenomena in different domains. With the DriveAFM, you can visualize the DNA double helix, observe the complex patterns of 2D materials and their atomic structure, and measure the electronic properties of semiconductors with high precision. The DriveAFM features CleanDrive, a photothermal cantilever excitation system that ensures optimal stability and performance. It also enables WaveMode, the fastest off-resonance mode on the market. The DriveAFM has a tip-scanning design that accommodates samples of various sizes and shapes without compromising its performance.
LensAFM Extend the Resolution of Optical Microscopes

LensAFM Extend the Resolution of Optical Microscopes

The Nanosurf LensAFM is an atomic force microscope that picks up where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can also be used to analyze various physical properties of a measurement sample.